Here is the answer for the question – In thin film interference, the condition for an intensity maximum (constructive interference) upon reflection is 2Ln = (m + 1/2) x wavelength …. You’ll find the correct answer below
In thin film interference, the condition for an intensity maximum (constructive interference) upon reflection is 2Ln = (m + 1/2) x wavelength …
a. if both reflected waves undergo a 180 degree phase shift
b. if one of the reflected waves undergoes a 180 degree phase shift
c. if neither undergo a phase shift
d. all the time regardless of phase shifts.
The Correct Answer is
b
Reason Explained
b is correct for In thin film interference, the condition for an intensity maximum (constructive interference) upon reflection is 2Ln = (m + 1/2) x wavelength …
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