Here is the answer for the question – **In thin film interference, the condition for an intensity maximum (constructive interference) upon reflection is 2Ln = (m + 1/2) x wavelength …**. You’ll find the correct answer below

### In thin film interference, the condition for an intensity maximum (constructive interference) upon reflection is 2Ln = (m + 1/2) x wavelength …

a. if both reflected waves undergo a 180 degree phase shift

b. if one of the reflected waves undergoes a 180 degree phase shift

c. if neither undergo a phase shift

d. all the time regardless of phase shifts.

**The Correct Answer is**

**b**

### Reason Explained

b is correct for In thin film interference, the condition for an intensity maximum (constructive interference) upon reflection is 2Ln = (m + 1/2) x wavelength …

Thankyou for using answerout. We hope you get all your answers here. If you have any special questions, you can comment to ask us.

Latest posts by Alex Timmons (see all)

- Among developed nations which of the following statements is true? - June 3, 2023
- When sketching the graph of y=Atan(Bx+C)+D which of the following best describes how to determine theâ€‹ x-coordinates of the halfway points of the principalâ€‹ cycle? - June 3, 2023
- Which of the following expressions is equivalent to the angle pi/6? - June 3, 2023